Hitachi S-4100 FE-SEM at Spectral Imaging Facility

The facility acquired in February 2008 through a gift from Hitachi High Technologies America an S-4100 FE-SEM turbo with an Oxford Instruments INCA Energy EDS (Energy Dispersive X-ray Spectrometer) attachment, which allows for micro-feature elemental analysis. The S-4100 has a larger sample chamber than the S-800, can resolve features smaller than 2 nm, and capture digital micrograph images using Quartz PCI Slow Scan software.

 

Select the figure below to view recent SEM micrographs:

 

Figure 1 Ant stinger

Figure 2 Ant head with antennae

Figure 3 Au on Mag Tape 1 kV

Figure 4 Au on mag Tape 30 kV

Figure 5 Glass sphere on Si AFM cantilever

Figure 6 Gun Shot Residue proficiency particle (secondary electron image)

Figure 7 GSR particle EDS spectrum of fig. 6

Figure 7 GSR particle

Figure 8 GSR particle EDS spectrum of fig. 7

Figure 9 NIH 3T3 cell incubated on fibronectin coated substrate

Figure 10 NIH 3T3 cell incubated on fibronectin-coated substrate ruffling detail in fig.  9

 

The Spectral Imaging Facility is self-supporting through recharges to University of California researchers and affiliates with tiered rates for weekday and after hours use. Researchers may submit samples for imaging or complete user certification training and obtain after hours access to the facility at reduced recharge rates. This shared use facility on the UC Davis campus is located in Chemistry Laboratory 0011.

 

Certification training simply requires user to demonstrate the ability to operate SEM and EDS and to understand facility safety protocols.  Two 2-hour sessions for the SEM and EDS are generally sufficient to complete the certification requirements.

 

The current recharge rates for microscope training and use are

 

SEM-EDS $35/hr weekdays $15/hr after hours non-UC affiliate $75/hr

 

AFM-Confocal  $50/hr weekdays  $15/hr after hours non-UC affiliate  $107/hr

 

Laser Raman $15/hr all hours and $32/hr non-UC affiliates

 

Also available for general use at no charge is a dedicated computer work station affording
image analysis using off-line versions of the various microscope software.

 

The NEAT ORU Spectral Imaging Facility opened in September of 2005 to
support investigation and research in bio-nano and nanomaterials with an
instrumentation grant from the National Science Foundation MRI program.
The facility provides to researchers a state-of-the-art high resolution combined
Atomic Force Microscope and Laser Scanning Confocal Microscope

Asylum Research MFP3D AFM and Olympus America FluoView 1000 LSCM, a

Field Emission SEM – Hitachi S-4100 with Oxford INCA EDS attachment, and a

Renishaw RM 1000 laser Raman microscope with 2D capability.

 
Please contact the development engineer for the facility, Mr. Alan
Hicklin (sif-info@ucdavis.edu), for details regarding training,
scheduling, and advice on sample preparation.

 

See more facility information under Spectral Imaging Facility at http://neat.ucdavis.edu/  and our Smart Site Project “Spectral Imaging Fac”.

 

 

Figure 1 Ant stinger                                                                                     A Hicklin

 

 

Figure 2 Ant head with antennae                                                                A Hicklin

 

 

Figure 3 Au on magnetic tape 1 kV                                           A. Hicklin

 

 

Figure 4 Au on magnetic tape 30 kV                                                       A. Hicklin

 

 

Figure 5 40 um glass sphere on Si AC160 AFM cantilever           Dr. V. Lulevich

 

 

Figure 6 Gun Shot Residue proficiency particle (secondary electron image)

 

 

Figure 7 GSR particle EDS spectrum of fig. 6                                                              A. Hicklin

 

 

Figure 7 GSR particle

 

 

Figure 8 GSR particle EDS spectrum of fig. 7                                                                A. Hicklin

 

 

Figure 9 NIH 3T3 cell incubated on fibronectin coated substrate                  Dr. L. Shi

 

 

Figure 10 NIH 3T3 cell incubated on fibronectin-coated substrate ruffling detail

in fig.  9                                                                                                                  Dr. L. Shi

 

 

Figure 11 Indium Phosphide optical waveguide ridge          Dr. F. Soares